Photos

  • ICDS 2017:29th International Conference on Defect in Semiconductor, July31-Auguest4,2017,Matsue,Japan.
    ICDS 2017:29th International Conference on Defect in Semiconductor,
    July31-Auguest4,2017,Matsue,Japan.
  • The Japan Society of Vacuum and Surface Science
    The Japan Society of Vacuum and Surface Science
    Technical award
    August 18, 2017, Yokohama City University
  • 24th International Conference on Ion Implantation Technology
    24th International Conference on Ion Implantation Technology
    September 20-26,2024
    Toyama International Conference Center,
    Toyama, Japan
  • The 22nd International Workshop on Junction Technology
    The 22nd International Workshop on Junction Technology
    IWJT 2025 June 4th-6th,2025,
    Kyoto University
第70回 応用物理学会　春季学術講演会
第70回 応用物理学会　春季学術講演会
2023年3月15日〜18日
上智大学　四谷キャンパス
 
“Proximity Gettering Design of Hydrocarbon Molecular Ion Implanted Silicon Wafers using Direct Bonding Technique for Advanced CMOS Image Sensors”　(Invited)　Kazunari Kurita
“Proximity Gettering Design of Hydrocarbon Molecular Ion Implanted Silicon Wafers using Direct Bonding Technique for Advanced CMOS Image Sensors” (Invited) Kazunari Kurita
2018 ECS and SMEQ Joint International Meeting
September 30 – October 4, 2018 Cancun Mexico
Semiconductor Wafer Bonding: Science, Technology, and Applications 15
2018 ECS and SMEQ Joint International Meeting
 
Materials Science in Semiconductor ProcessingのCertificate of Reviewing
Materials Science in Semiconductor ProcessingのCertificate of Reviewing
 

Physica Status Solidi a

  • Physica Status Solidi a - 2019
    Physica Status Solidi  a - 2019
    - Suzuki - Fundamental Characteristics of Cyanide‐Related Multielement Molecular
  • Physica Status Solidi a - 2017
    Physica Status Solidi  a - 2017
    - Kurita - Proximity gettering technology for advanced CMOS image sensors using carbon